The inspection of surfaces using optical 3D metrology has made great progress in recent years. At the inVISION Metrology Day, different technologies will be presented that successfully master challenging 3D inspection tasks.

At 11:10 a.m., our application specialist, Ondrej Stafa, will present high-resolution 3D inspection solutions in the micro range for the inline use case. In doing so, we meet the highest standards in the automotive, medical technology and electronics sectors.

Are you unable to attend? No problem. Once registered, you will also have access to the recorded presentation.

Listen in and register here: free registration